Shanwar, S.: search on Z-Library

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1

Glutamine: pleiotropic roles in tumor growth and stress resistance

Naval P. Shanware, Andrew R. Mullen, Ralph J. DeBerardinis, Robert T. Abraham

Journal:

Journal of Molecular Medicine

Year:

2011

Language:

english

File:

PDF, 683 KB

english, 2011

2

Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors

Min, Bigang, Devireddy, Siva Prasad, Çelik-Butler, Zeynep, Shanware, Ajit, Green, Keith, Chambers, J. J., Visokay, M. V., Colombo, Luigi

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 325 KB

english, 2005

3

Hot-Carrier- and Constant-Voltage-Stress-Induced Low-Frequency Noise in Nitrided High- $k$ Dielectric MOSFETs

Rahman, M.S., Morshed, T.H., Celik-Butler, Z., Quevedo-Lopez, M.A., Shanware, A., Colombo, L.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2009

Language:

english

File:

PDF, 251 KB

english, 2009

4

The PI3K, Metabolic, and Autophagy Networks: Interactive Partners in Cellular Health and Disease

Shanware, Naval P., Bray, Kevin, Abraham, Robert T.

Journal:

Annual Review of Pharmacology

Year:

2013

Language:

english

File:

PDF, 615 KB

english, 2013

5

A complementary molecular-model (including field and current) for TDDB in SiO2 dielectrics

J.W. McPherson, R.B. Khamankar, A. Shanware

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 657 KB

english, 2000

6

Complementary model for intrinsic time-dependent dielectric breakdown in SiO[sub 2] dielectrics

J. W. Mcpherson, R. B. Khamankar, A. Shanware

Journal:

Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 621 KB

english, 2000

7

Impact of interfacial layer on low-frequency noise of HfSiON dielectric MOSFETs

Bigang Min, Devireddy, S.P., Celik-Butler, Z., Shanware, A., Colombo, L., Green, K., Chambers, J.J., Visokay, M.R., Rotondaro, A.L.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 342 KB

english, 2006

8

Physics-based 1/f noise model for MOSFETs with nitrided high-κ gate dielectrics

Tanvir Hasan Morshed, Siva Prasad Devireddy, Zeynep Çelik-Butler, Ajit Shanware, Keith Green, J.J. Chambers, M.R. Visokay, Luigi Colombo

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 462 KB

english, 2008

9

SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise in Devices and Circuits III - Flicker noise in nitrided high-k dielectric NMOS transistors

Min, Bigang, Balandin, Alexander A., Danneville, Francois, Devireddy, Siva P., Celik Butler, Zeynep, Deen, M. Jamal, Fleetwood, Daniel M., Shanware, Ajit, Green, Keith, Chambers, J. J., Visokay, M. V.

Year:

2005

Language:

english

File:

PDF, 325 KB

english, 2005

10

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Evaluation of the positive biased temperature stress stability in HfSiON gate dielectrics

Shanware, A., Visokay, M.R., Chambers, J.J., Rotondaro, A.L.P., Bu, H., Bevan, M.J., Khamankar, R., Aur, S., Nicollian, P.E., McPherson, J., Colombo, L.

Year:

2003

Language:

english

File:

PDF, 436 KB

english, 2003

11

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Reliability evaluation of HfSiON gate dielectric film with 12.8 Å SiO/sub 2/ equivalent thickness

Shanware, A., McPherson, J., Visokay, M.R., Chambers, J.J., Rotondaro, A.L.P., Bu, H., Bevan, M.J., Khamankar, R., Colombo, L.

Year:

2001

Language:

english

File:

PDF, 350 KB

english, 2001

12

Modeling of charge trapping induced threshold-voltage instability in high-/spl kappa/ gate dielectric FETs

Yang Liu,, Shanware, A., Colombo, L., Dutton, R.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 171 KB

english, 2006

13

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A new model for 1/f noise in high-κ MOSFETs

Morshed, Tanvir, Devireddy, Siva Prasad, Rahman, M. Shahriar, Celik-Butler, Zeynep, Tseng, Hsing-Huang, Zlotnicka, Ania, Shanware, Ajit, Green, Keith, Chambers, J. J., Visokay, M. R., Quevedo-Lopez, M

Year:

2007

Language:

english

File:

PDF, 1.43 MB

english, 2007

14

Thermal stability of hafnium–silicate and plasma-nitrided hafnium silicate films studied by Fourier transform infrared spectroscopy

M. A. Quevedo-lopez, J. J. Chambers, M. R. Visokay, A. Shanware, L. Colombo

Year:

2005

Language:

english

File:

PDF, 742 KB

english, 2005

15

Promising Biological Indicator of Heavy Metal Pollution: Bioluminescent Bacterial Strains Isolated and Characterized from Marine Niches of Goa, India

Thakre, Neha A., Shanware, Arti S.

Journal:

Indian Journal of Microbiology

Year:

2015

Language:

english

File:

PDF, 993 KB

english, 2015

16

Analysis of the CSF model for simulated loss of coolant accident conditions

Thangamani, I., Dutta, A., Shanware, V. M., Verma, V., Singh, R. K.

Journal:

Year:

2014

Language:

english

File:

PDF, 927 KB

english, 2014

17

JcMYB1 , a Jatropha R2R3 MYB transcription factor, modulates lipid biosynthesis in transgenic plants

Khan, Kasim, Kumar, Vinod, Niranjan, Abhishek, Shanware, Aarti, Sane, Vidhu A

Journal:

Plant and Cell Physiology

Year:

2018

Language:

english

File:

PDF, 3.03 MB

english, 2018

18

Analysis of the basic patterns of an estuarine shore in the vicinity of the Coringa bay, Andhra Pradesh, India

T. A. Rao, A. R. K. Sastry, P. G. Shanware

Journal:

Proceedings: Plant Sciences

Year:

1972

Language:

english

File:

PDF, 2.35 MB

english, 1972

19

Experiments and analytical studies related to blowdown and containment thermal hydraulics on CSF

Dutta, Anu, Thangamani, I., Shanware, V.M., Rao, K.S., Gera, B., Ravi Kiran, A., Goyal, P., Verma, Vishnu, Sharma, P.K., Agrawal, M.K., Ganju, S., Singh, R.K.

Journal:

Nuclear Engineering and Design

Year:

2015

Language:

english

File:

PDF, 1.81 MB

english, 2015

20

UCNP-based Photoluminescent Nanomedicines for Targeted Imaging and Theranostics of Cancer

Guryev, Evgenii L., Smyshlyaeva, Anita S., Shilyagina, Natalia Y., Sokolova, Evgeniya A., Shanwar, Samah, Kostyuk, Alexey B., Lyubeshkin, Alexander V., Schulga, Alexey A., Konovalova, Elena V., Lin, Q

Journal:

Year:

2020

File:

PDF, 1.94 MB

2020

21

Amyotrophic Lateral Sclerosis-associated Proteins TDP-43 and FUS/TLS Function in a Common Biochemical Complex to Co-regulate HDAC6 mRNA

Kim, S. H., Shanware, N. P., Bowler, M. J., Tibbetts, R. S.

Journal:

Journal of Biological Chemistry

Year:

2010

Language:

english

File:

PDF, 3.48 MB

english, 2010

22

[AIP NOISE AND FLUCTUATIONS: 19th International Conference on Noise and Fluctuations; ICNF 2007 - Tokyo (Japan) (9-14 September 2007)] AIP Conference Proceedings - Effect of Nitrogen Incorporation Methods on 1/f Noise and Mobility Characteristics in HfSiON NMOSFETs

Rahman, M. Shahriar, Morshed, Tanvir, Devireddy, S. P., Quevedo-Lopez, M. A., Shanware, Ajit, Colombo, Luigi, Çelik-Butler, Zeynep

Year:

2007

Language:

english

File:

PDF, 229 KB

english, 2007

23

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - 45-nm node NiSi FUSI on nitrided oxide bulk CMOS fabricated by a novel integration process

Yu, S., Lu, J.-P., Mehrad, F., Bu, H., Shanware, A., Ramin, M., Pas, M., Visokay, M.R., Vitale, S., Yang, S.-H., Jiang, P., Hall, L., Montgomery, C., Obeng, Y., Bowen, C., Hong, H., Tran, J., Chapman,

Year:

2005

Language:

english

File:

PDF, 510 KB

english, 2005

24

Casein Kinase 1-dependent Phosphorylation of Familial Advanced Sleep Phase Syndrome-associated Residues Controls PERIOD 2 Stability

Shanware, N. P., Hutchinson, J. A., Kim, S. H., Zhan, L., Bowler, M. J., Tibbetts, R. S.

Journal:

Journal of Biological Chemistry

Year:

2011

Language:

english

File:

PDF, 2.36 MB

english, 2011

25

The effects of Ge content in poly-Si1−xGex gate material on the tunneling barrier in PMOS devices

A Shanware, H.Z Massoud, A Acker, V.Z.-Q Li, M.R Mirabedini, K Henson, J.R Hauser, J.J Wortman

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 276 KB

english, 1999

26

[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Extraction of the gate oxide thickness of N- and P-Channel MOSFETs below 20 Å from the substrate current resulting from valence-band electron tunneling

Shanware, A., Shiely, J.P., Massoud, H.Z., Vogel, E., Henson, K., Srivastava, A., Osburn, C., Hauser, J.R., Wortman, J.J.

Year:

1999

Language:

english

File:

PDF, 395 KB

english, 1999

27

Fusarium graminearum microRNA-like RNAs and their interactions with wheat genome: a much-needed study

Kharbikar, Lalit L., Shanware, Arti S., Saharan, M. S., Nandanwar, Shweta K., Sivalingam, P. N., Gurjar, Malkhan S., Aggarwal, Rashmi

Journal:

Indian Phytopathology

Year:

2019

Language:

english

File:

PDF, 830 KB

english, 2019

28

Coregulated Ataxia Telangiectasia-mutated and Casein Kinase Sites Modulate cAMP-response Element-binding Protein-Coactivator Interactions in Response to DNA Damage

Shanware, N. P., Trinh, A. T., Williams, L. M., Tibbetts, R. S.

Journal:

Journal of Biological Chemistry

Year:

2006

Language:

english

File:

PDF, 869 KB

english, 2006

29

Detection of Mesta yellow vein mosaic virus (MeYVMV) in field samples by a loop-mediated isothermal amplification reaction

Meena, Prabhu Narayan, Kharbikar, Lalit Laxman, Rana, Rajeev Singh, Satpathy, Subrata, Shanware, Arti, Sivalingam, Palaiyur Nanjappan, Nandanwar, Shweta

Journal:

Journal of Virological Methods

Year:

2018

Language:

english

File:

PDF, 404 KB

english, 2018

30

Glutamine deprivation stimulates mTOR-JNK-dependent chemokine secretion

Shanware, Naval P., Bray, Kevin, Eng, Christina H., Wang, Fang, Follettie, Maximillian, Myers, Jeremy, Fantin, Valeria R., Abraham, Robert T.

Journal:

Nature Communications

Year:

2014

Language:

english

File:

PDF, 2.96 MB

english, 2014

31

[AIP NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009) - Pisa (Italy) (14–19 June 2009)] AIP Conference Proceedings - Low Frequency Noise Degradation in 45 nm High-k nMOSFETs due to Hot Carrier and Constant Voltage Stress

Rahman, M. Shahriar, Çelik-Butler, Zeynep, Quevedo-Lopez, M. A., Shanware, Ajit, Colombo, Luigi, Macucci, Massimo, Basso, Giovanni

Year:

2009

Language:

english

File:

PDF, 225 KB

english, 2009

32

Comparison of Valence-Band Tunneling in Pure SiO2, Composite SiO2 /Ta2O5, and Pure Ta2O5, in Mosfets with 1.0 nm-Thick SiO2-Equivalent Gate Dielectrics

Shanware, A., Massoud, H. Z., Vogel, E., Henson, K., Hauser, J. R., Wortman, J. J.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 316 KB

english, 1999

33

Regulation of Ribosomal Protein S6 Phosphorylation by Casein Kinase 1 and Protein Phosphatase 1

Hutchinson, J. A., Shanware, N. P., Chang, H., Tibbetts, R. S.

Journal:

Journal of Biological Chemistry

Year:

2011

Language:

english

File:

PDF, 2.11 MB

english, 2011

34

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Proposed universal relationship between dielectric breakdown and dielectric constant

McPherson, J., Kim, J., Shanware, A., Mogul, H., Rodriguez, J.

Year:

2002

Language:

english

File:

PDF, 243 KB

english, 2002

35

Bone marrow biopsy specimens in assessment of remission in acute leukaemias.

Singh, T, Dubey, A P, Shanware, A, Choudhury, P, Galha, M

Journal:

Journal of Clinical Pathology

Year:

1993

Language:

english

File:

PDF, 316 KB

english, 1993

36

Influence of UV and Gamma Rays Irradiation on Luminescent Bacteria and Exploring Their Efficacy as Biosensor

Wanjari, Rashmi A., Shanware, Arti S., Dhoble, Sanjay J.

Journal:

Year:

2020

File:

PDF, 996 KB

2020

37

Identification of Carboxyl-terminal MCM3 Phosphorylation Sites Using Polyreactive Phosphospecific Antibodies

Shi, Y., Dodson, G. E., Mukhopadhyay, P. S., Shanware, N. P., Trinh, A. T., Tibbetts, R. S.

Journal:

Journal of Biological Chemistry

Year:

2007

Language:

english

File:

PDF, 1.09 MB

english, 2007

38

Modeling the Dependence of the Gate Current on Ge Content in Ultrathin Gate Dielectric Pmos Devices with Poly-Si1−Gex Gate Material

Shanware, A., Massoud, H. Z., Acker, A., Li, V. Z. Q., Mirabedini, M. R., Henson, K., Hauser, J. R., Wortman, J. J.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 360 KB

english, 1999

39

Trends in the ultimate breakdown strength of high dielectric-constant materials

McPherson, J.W., Jinyoung Kim, Shanware, A., Mogul, H., Rodriguez, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 760 KB

english, 2003

40

Carrier mobility in MOSFETs fabricated with Hf-Si-O-N gate dielectric, polysilicon gate electrode, and self-aligned source and drain

Rotondaro, A.L.P., Visokay, M.R., Shanware, V.A., Chambers, J.J., Colombo, L.

Journal:

IEEE Electron Device Letters

Year:

2002

Language:

english

File:

PDF, 193 KB

english, 2002

41

Effect of nitrogen incorporation on 1/f noise performance of metal-oxide-semiconductor field effect transistors with HfSiON dielectric

Shahriar Rahman, M., Morshed, Tanvir, Devireddy, S. P., Çelik-Butler, Zeynep, Quevedo-Lopez, M. A., Shanware, A., Colombo, L.

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 723 KB

english, 2008

42

[IEEE 2002 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (11-13 June 2002)] 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) - Advanced CMOS transistors with a novel HfSiON gate dielectric

Rotondaro, A.L.P., Visokay, M.R., Chambers, J.J., Shanware, A., Khamankar, R., Bu, H., Laaksonen, R.T., Tsung, L., Douglas, M., Kuan, R., Bevan, M.J., Grider, T., McPherson, J., Colombo, L.

Year:

2002

Language:

english

File:

PDF, 232 KB

english, 2002

43

Application of HfSiON as a gate dielectric material

M. R. Visokay, J. J. Chambers, A. L. P. Rotondaro, A. Shanware, L. Colombo

Year:

2002

Language:

english

File:

PDF, 478 KB

english, 2002

44

Self-Consistent Mosfet Tunneling Simulations—Trends in the Gate and Substrate Currents and the Drain-Current Turnaround Effect with Oxide Scaling

Massoud, H. Z., Shiely, J. P., Shanware, A.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 894 KB

english, 1999

45

Modeling the trends in valence-band electron tunneling in NMOSFETs with ultrathin SiO2 and SiO2Ta2O5 dielectrics with oxide scaling

A. Shanware, H.Z. Massoud, E. Vogel, K. Henson, J.R. Hauser, J.J. Wortman

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 290 KB

english, 1999

46

Thermochemical description of dielectric breakdown in high dielectric constant materials

McPherson, J., Kim, J-Y., Shanware, A., Mogul, H.

Journal:

Applied Physics Letters

Year:

2003

Language:

english

File:

PDF, 502 KB

english, 2003

47

Isolation and characterization of novel marine luminescent bacteria from Diu beach, India

Shanware, Arti, Thakre, Neha, Pande, Sunil

Journal:

Journal of Pharmacy Research

Year:

2013

Language:

english

File:

PDF, 645 KB

english, 2013

48

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Resolving the non-uniqueness of the activation energy associated with TDDB for SiO/sub 2/ thin films

Shanware, A., Khamankar, R.B., McPherson, W.

Year:

2000

Language:

english

File:

PDF, 343 KB

english, 2000

49

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Characterization and comparison of the charge trapping in HfSiON and HfO/sub 2/ gate dielectrics

Shanware, A., Visokay, M.R., Chambers, J.J., Rotondaro, A.L.P., McPherson, J., Colombo, L.

Year:

2003

Language:

english

File:

PDF, 272 KB

english, 2003

50

[AIP NOISE AND FLUCTUATIONS: 19th International Conference on Noise and Fluctuations; ICNF 2007 - Tokyo (Japan) (9-14 September 2007)] AIP Conference Proceedings - Variable Temperature Characteristics of Devices With HfSiON as The High-κ Dielectric on Nitrided Silicate (SiON) Interfacial Layer

Morshed, Tanvir Hasan, Çelik-Butler, Zeynep, Devireddy, Siva Prasad, Rahman, Mohammad Shahriar, Shanware, Ajit, Green, Keith, Chambers, J. J., Visokay, M. R., Colombo, Luigi

Year:

2007

Language:

english

File:

PDF, 363 KB

english, 2007

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